The 1510A Precision Portable Signal Generator is a must-have for engineers and technicians working in a variety of fields – from routine troubleshooting and maintenance, to calibrating and tuning advanced equipment such as eddy current probes, strain gauge amplifiers, or charge amplifiers for gas turbine vibration analysis.
Semiconductor / Solar Metrology Systems
MTI Instruments offers manual and semi-automated metrology systems for the solar and semiconductor industries. These capacitance based systems, built around the company’s proprietary push/pull technology, provide non-contact measurement of thickness, TTV, and bow/warp.
The Proforma 300iSA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials delivering full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness.
A high-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
Custom Capacitance Sensors: Measure displacement and gap with non-contact force at sub-micron resolution. Ideal for applications such as lobing, lens focusing, Piezo positioning, sheet metal thickness, gap measurement, as well as flatness and alignment test applications.